Keynotes
During the Plenary Session on Tuesday, we will feature two keynote presentations: one by Esteban Menargues, Head of Space RF Products at SWISSto12, and another by Joel Dunsmore, a Keysight R&D Fellow.
3D Printed RF Payloads and Phased Arrays
Esteban Menargues, Head of Space RF Products, SWISSto12
Abstract: Additive Manufacturing, commonly known as 3D printing, has experienced a significant growth in the past years, and it is already considered by the Space industry as fabrication standard for RF passive hardware. The main advantages of AM are very high repeatability, very competitive cost, possibility of fabricating monolithic components (i.e. single-block components that do not require additional assembly as well as internal interfaces), ultra-light weight, short-fabrication time, “PIM-free” performance and increased design freedom. SWISSto12 has been one of the main contributors to this growth, with multiple examples ranging from waveguides to complex feeds. Currently, the company develops 3D printed-based RF payloads for the first SWISSto12’s HummingSat contracts with Intelsat and Inmarsat, as well as 3D printed-based phased arrays with unprecedented performance in terms of radiation efficiency. The plenary talk will review the advantages of 3D printing through several microwave components and antenna systems developed by SWISSto12 using this technology.
VNA Everywhere, VNA Everything: The History and Evolution of the Modern Network Analyzer, and why 6G Needs It
Joel Dunsmore, R&D Fellow, Keysight Technologies
Abstract: Perhaps no other electronic measurement instrument has gone through the evolutions that are seen in modern Network Analyzers. What started as a fast, sweeping power meter has become the workhorse of modern test stands. This talk will review the history and evolution of network analyzers, illuminating key technological advances that enabled this progress, resulting in the unique capabilities that we find are required for the 6G sub-THz applications. It will conclude with some ideas of future trends and needs in test instruments.
